Department of Design and Diagnostics of Digital Systems

Institute of Informatics of the Slovak Academy of Sciences

Current projects

  • APVV LPP-0140-09 - VILAB - Virtual digital design laboratory for high schools
  • Project under the agreement of scientific cooperation - Design and testability of low power processor and MDCT algorithm in 90nm CMOS technology (Institute of Informatics and Institute of Microelectronics and Optoelectronics, Warsaw University of Technology), 2010-2012.

 

Past projects

  • VEGA 2/0135/08 - Reliable Architectures and Digital Systems Testability, 2008-2010.
  • APVV LPP-0021-06 - Microelectronics in Secondary Education Network - MikroN, 2006-2009.
  • VEGA 2/5123/25 - Methods and Algorithms for Optimal Testing of Digital Systems on Chip, 2005-2007.
  • VEGA 2/2066/22 - Testable Digital Cores of Data Encryption and Decryption Algorithms, 2002-2004.
  • VEGA 6091/99 - Behavioral and Real Defect Oriented Test Generation for Digital Circuits and Systems, 1999-2000. 
  • VEGA 1/4294 - Advanced Approaches towards Integrated Circuit and System Design, 1997-1999.
  • VEGA 2/3041 - Advanced Test Pattern Generation Algorithms for Diagnosis of Digital Structures, 1996-1998.
  • Project under the agreement of scientific cooperation - Digital systems design and its testability (Institute of Informatics and Institute of Microelectronics and Optoelectronics, Warsaw University of Technology), 2007-2009.
  • Slovak-Italian Science and Technology Co-operation - Testable and Reconfigurable Digital Cores (Institute of Informatics and Politechnico di Torino), 2004-2007.
  • IST-2000-30193 - REASON - Research and Training Action for System on Chip Design, 2000-2005.
  • INCO COPERNICUS CP977133 - VILAB - Microelectronics Virtual Laboratory for Co-operating in Research and Knowledge Transfer, 1998-2001. 
  • COPERNICUS C994 0391 - UBISTA - Unified Built in Self Test Approach for Full Detect Testing in Mixed Signal Devices, 1995-1998. 
  • ESPRIT 6575 - ATSEC - Advanced Test Generation and Testable Design Methodology for Sequential Circuits, 1994-1995. 
  • COPERNICUS CP0536 - BENEFIT - Concerted Action for Stimulation of East-West Collaborations in the Areas of Microelectronics and Signal Processing, 1994-1996.
  • COPERNICUS CP9624 - FUTEG - Functional Test Generation and Diagnosis, 1994-1997. 
  • PECO 7668 - EEMCN - East European Microelectronics Co-operation Network of Support and Competence Centres of Central and Eastern European Countries, 1993-1996.